Title:
MALFUNCTION DIAGNOSIS METHOD AND MALFUNCTION DIAGNOSIS SYSTEM
Document Type and Number:
Japanese Patent JP2016139274
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a malfunction diagnosis method, etc. capable of speedily detecting malfunction.SOLUTION: The method includes: a parameter value acquisition step S1 of acquiring a plurality of parameter values included in an input signal Si and an output signal So of an actual machine 5; a malfunction detection step S2 of using a mahalanobis Taguchi method to calculate a mahalanobis distance from a unit space on the basis of the obtained parameter values and diagnosing whether a malfunction has occurred in the actual machine 5 on the basis of the calculated mahalanobis distance; a malfunction position estimation step S3 of estimating a malfunction position of the actual machine 5 on the basis of the mahalanobis distance calculated in the malfunction detection step S2; and a conformity determination step S5 of constructing a malfunction analytic model M for analysing the actual machine 5 on the basis of the malfunction position of the actual machine 5, which has been estimated in the malfunction position estimation step S3, and determining whether an analysis output signal Sv of the actual machine 5, the signal being obtained by analysing the malfunction analytic model M, and the output signal So outputted by the actual machine 5 conform to each other.SELECTED DRAWING: Figure 2
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Inventors:
NAGASE TETSUYA
Application Number:
JP2015013754A
Publication Date:
August 04, 2016
Filing Date:
January 27, 2015
Export Citation:
Assignee:
MITSUBISHI HEAVY IND LTD
International Classes:
G05B23/02; B64G1/28
Domestic Patent References:
| JP2007213194A | 2007-08-23 | |||
| JPH086635A | 1996-01-12 | |||
| JP2012512351A | 2012-05-31 |
Foreign References:
| WO2010061681A1 | 2010-06-03 |
Attorney, Agent or Firm:
Hiroaki Sakai
Jun Takamura
Jun Takamura
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