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Patent Searching and Data


Title:
MASK
Document Type and Number:
Japanese Patent JP2013084373
Kind Code:
A
Abstract:

To provide a mask for forming a high-definition thin film pattern and capable of suppressing damage caused by impurities to the thin film pattern.

A mask 1 which contacts and installed to a substrate is provided for forming multiple types of thin film patterns in certain forms. The mask 1 comprises: a resin film 2 which transmits visible light; and a holding member 3 for holding the resin film 2, which is formed by a plate body with a through-opening 5 having a shape larger than one thin film pattern corresponding to a formed region of the one thin film pattern among formed regions of the multiple types of thin film patterns predefined on the substrate. The film 2 includes an opening pattern 4 having the same shape as the one thin film pattern in the opening 5 of the holding member 3 corresponding to the formed region of the one thin film pattern on the substrate, and has a recess 6 having the same shape as other thin film pattern on a contact surface side of the substrate corresponding to a formed region of the other thin film pattern.


Inventors:
MIZUMURA MICHINOBU
Application Number:
JP2011221900A
Publication Date:
May 09, 2013
Filing Date:
October 06, 2011
Export Citation:
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Assignee:
V TECHNOLOGY CO LTD
International Classes:
H05B33/10; C23C14/04; H01L51/50
Domestic Patent References:
JPH1050478A1998-02-20
JP2000096211A2000-04-04
JP2008208426A2008-09-11
JP2010065297A2010-03-25
JP2010116579A2010-05-27
JP2009520110A2009-05-21
Foreign References:
WO1997034447A11997-09-18
Attorney, Agent or Firm:
Tomijio Sasashima
Haruyuki Nishiyama
Shoichi Okuyama
Moriaki Ogawa
Kunio Araki
Taiki Kaji