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Patent Searching and Data


Title:
MEASURING DEVICE AND MEASURING SYSTEM
Document Type and Number:
Japanese Patent JP2004318301
Kind Code:
A
Abstract:

To provide a measuring device capable of improving line quality between a slave machine and a master machine.

This measuring device 1b comprises a measuring part 11 measuring parameters of equipment 3b to be measured and acquiring measurement data D1b, and a control part 15 inputting the measurement data D1b and transmitting the measurement data D1b via a communication part 14. The control part 15 re-transmits the measurement data D1a until normal completion of receiving of the measurement data D1a by a measurement device 1a, counts the number of the re-transmissions, and stores the number of re-transmissions together with a time stamp Dta indicating the measurement time of the measurement data D1a with being corresponded to the time stamp Dta.


Inventors:
MIZUNO ATSUSHI
Application Number:
JP2003108709A
Publication Date:
November 11, 2004
Filing Date:
April 14, 2003
Export Citation:
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Assignee:
HIOKI ELECTRIC WORKS
International Classes:
G08C15/00; G08C17/00; H04B17/00; H04Q9/00; (IPC1-7): G08C15/00; G08C17/00; H04Q9/00
Attorney, Agent or Firm:
Shinji Sakai