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Patent Searching and Data


Title:
MEASURING PLATE AND DEVICE FOR MEASURING WHEEL ALIGNMENT
Document Type and Number:
Japanese Patent JPH10213425
Kind Code:
A
Abstract:

To simplify the constitution of a device, to decrease the cost of manufacturing and to facilitate the control and the adjustment.

In a measuring plate 4, an optically uniform distance measuring region MLA is provided in the extending direction to the sides of the front and rear directions of a vehicle under inspection with respect to a measuring mark region MRK. Therefore, the distance to the measuring plate 4 can be accurately obtained without the effect on the measurement using the measuring mark region MRK by irradiating distance measuring light on the distance measuring region MLA. Thus, the accuracy of the measurement of wheel alignment can be improved. Furthermore, since the distance measuring region can be provided as the large area, outer distance measuring light emitting devices 6-1 and 6-2 for irradiating the distance measuring light can be used under the fixed state. The constitution of the device can be simplified without decreasing the measuring accuracy. Furthermore, the irradiating positions of the distance measuring light beams of the distance measuring light emitting devices 6-1 and 6-2 can be largely separated, and the angle measuring accuracy of the measuring plate 4 based on the distance difference of both parts can be improved.


Inventors:
UNO HIROSHI
Application Number:
JP1997000017185
Publication Date:
August 11, 1998
Filing Date:
January 30, 1997
Export Citation:
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Assignee:
SAGINOMIYA SEISAKUSHO INC
International Classes:
G01B11/00; B62D17/00; G01B11/26; (IPC1-7): G01B11/26; B62D17/00; G01B11/00
Attorney, Agent or Firm:
瀧野 秀雄 (外1名)