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Title:
MICROSCOPE SYSTEM
Document Type and Number:
Japanese Patent JP2010224486
Kind Code:
A
Abstract:

To provide a microscope system excellent in terms of workability.

The microscope system includes: a microscope for performing observation of a sample; an imaging apparatus for picking up the image of the sample through the microscope; an image processing means for forming an observation image of the sample from the picked-up image of the sample; a storage means for storing the observation image; an image analysis means for analyzing the observation image and the image stored in the storage means; an image retrieving means for retrieving the image fulfilling a predetermined condition and the image on a condition close to the predetermined condition from an image being a result of analysis, which is formed by the image processing means and stored in the storage means based on the result of the analysis; and a display means for displaying the observation image, the image being the result of analysis, and the image being the result of retrieval by the image retrieving means.


Inventors:
WATANABE AKIRA
IKO CHIKAYA
Application Number:
JP2009074591A
Publication Date:
October 07, 2010
Filing Date:
March 25, 2009
Export Citation:
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Assignee:
NIKON CORP
International Classes:
G02B21/00; G01N21/17
Domestic Patent References:
JP2003066339A2003-03-05
JP2006098794A2006-04-13
JP2004053498A2004-02-19
JP2009008846A2009-01-15
JP2002202463A2002-07-19
Foreign References:
WO2007074923A12007-07-05
Attorney, Agent or Firm:
Yoshio Inoue
Kenichi Aihara



 
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