Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
MODEL INSPECTION SUPPORT METHOD, MODEL INSPECTION SUPPORT PROGRAM, AND MODEL INSPECTION SUPPORT DEVICE
Document Type and Number:
Japanese Patent JP2013089057
Kind Code:
A
Abstract:

To solve such a problem in a model inspection system that when an inspection target model expands and the number of states increases to exceed the capacity of a computer, a phenomenon called "state explosion" occurs in which the computer cannot completely process all the states, by providing a model inspection support device which prevents the state explosion even for development of an embedded apparatus which requires real time property and includes time as a state in performance inspection of non-functional requirements.

A model inspection support method which supports model inspection of a development target system with a computer, includes steps of: dividing an inspection model 7 into a plurality of clusters; substituting a part of the plurality of clusters for a statistical model 8; calculating an inter-distribution distance of execution time by executing simulation for calculating execution time distribution on the inspection model 7 and the substituting models; determining that a cluster having the shortest inter-distribution distance as an appropriate cluster to substitute for the statistical model 8; and outputting an inspection program of a model substituting for the statistical model 8.


Inventors:
NAKAO SANAE
NAGANO TAKEHIKO
SHIGEOKA TOMOHIKO
Application Number:
JP2011229353A
Publication Date:
May 13, 2013
Filing Date:
October 19, 2011
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
HITACHI LTD
International Classes:
G06F11/36; G06F11/28
Attorney, Agent or Firm:
Manabu Inoue
Yuji Toda
Shigemi Iwasaki