Title:
MONITORING METHOD, MONITORING SYSTEM, MONITORING PROGRAM, AND RECORDING MEDIUM RECORDED WITH MONITORING PROGRAM
Document Type and Number:
Japanese Patent JP3722087
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To surely and easily deter a user from advancing carelessly into a monitoring area, when abnormality occurred within the monitoring area.
SOLUTION: A monitoring system 10 for monitoring a house 11 as the monitoring area is provided with sensors 13 in proper places inside the house 11, and a door opening blocking device 15 for blocking opening of a main entrance door 14 provided in an entrance of the house 11. A controller 17 issues an indication to the door opening blocking device 15 to deter the entrance door from being opened when detecting the abnormality within the house 11, based on a detection signal from any of the sensors 13.
Inventors:
Tanichi Ando
Atsushi Shimizu
Yasuhiro Yamaguchi
Hiroya Ueda
Atsushi Shimizu
Yasuhiro Yamaguchi
Hiroya Ueda
Application Number:
JP2002137818A
Publication Date:
November 30, 2005
Filing Date:
May 13, 2002
Export Citation:
Assignee:
OMRON Corporation
International Classes:
G08B13/00; E05B45/06; E05B65/10; G08B17/00; G08B25/04; G08B25/10; H04W24/00; H04W28/00; (IPC1-7): G08B13/00; G08B25/04; G08B25/10; H04Q7/38
Domestic Patent References:
| JP7293071A | ||||
| JP10055496A | ||||
| JP2002041688A | ||||
| JP2000235688A | ||||
| JP2001283357A | ||||
| JP11313901A | ||||
| JP2000182174A | ||||
| JP2001126173A | ||||
| JP10062962A |
Attorney, Agent or Firm:
Kenzo Hara International Patent Office
Kenzo Hara
Kenzo Hara
Previous Patent: SEMICONDUCTOR CHIP STORAGE CASE AND SEMICONDUCTOR DEVICE
Next Patent: SURFACE HARDENING METHOD FOR ALUMINUM
Next Patent: SURFACE HARDENING METHOD FOR ALUMINUM