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Patent Searching and Data


Title:
PLASMA CVD SYSTEM
Document Type and Number:
Japanese Patent JPS6490522
Kind Code:
A
Abstract:

PURPOSE: To remove deposit which was deposited out of a plasma producing area owing to gas flow through a plasma etching process, by making an earth shield which has controlled the spread of plasma to be at the same potential as that of an electrode which applies a voltage in the plasma etching.

CONSTITUTION: In the thin film formation being performed owing to plasma decomposition, an earth shield 9 is connected through both contacts A and C to the earth so that the spread of the plasma is effectively controlled. On the other hand, in plasma etching being performed, the earth shield 9 is connected through both contacts A and B to a power source to be at the same potential as that of an electrode 2, so that the plasma is made to be sufficiently spread. As a result, the deposit which was deposited out of a plasma producing area owing to gas flow is effectively etched away by the plasma etching.


Inventors:
TOGAWA EIJI
Application Number:
JP24882687A
Publication Date:
April 07, 1989
Filing Date:
October 01, 1987
Export Citation:
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Assignee:
SEIKO EPSON CORP
International Classes:
H01L21/205; H01L31/04; (IPC1-7): H01L21/205; H01L31/04
Domestic Patent References:
JPS62130524A1987-06-12
Attorney, Agent or Firm:
Kisaburo Suzuki (1 outside)