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Title:
QUALITY TESTING METHOD OF PHYSICAL RANDOM NUMBER GENERATION CIRCUIT, RANDOM NUMBER GENERATOR, AND ELECTRONIC DEVICE
Document Type and Number:
Japanese Patent JP2016081247
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To realize a physical random number generator mounted with a testing circuit for executing in an on-chip manner a test capable of obtaining reliability closer to reliability capable of being obtained by executing an IID test.SOLUTION: A random number generator includes: a physical random number generation circuit 41; a score lists storage part 54 for storing an upper limit value and a lower limit value for regulating a distribution range of the score for each kind with respect to multiple kinds of scores of each of multiple mutation random number sequences generated by shuffling an initial random number sequence generated by the physical random number generation circuit; a sub-set random number storage part 51 for storing a verification random number sequence generated by the physical random number generation circuit; a score calculation circuit 52 for calculating multiple kinds of scores of the verification random number sequence; a comparison circuit 55 for comparing the calculated multiple score values with the upper limit value and the lower limit value stored in the score list storage part and determining a frequency by which the values of multiple scores of the verification random number sequence are distributed to the distribution range; and a propriety discrimination circuit 56 for determining whether or not the quality of the physical random number generation circuit is good based on the comparison result.SELECTED DRAWING: Figure 7

Inventors:
KOKUBO HIROTAKA
YAMAMOTO MASARU
TAKENAKA MASAHIKO
FURUKAWA KAZUYOSHI
Application Number:
JP2014210969A
Publication Date:
May 16, 2016
Filing Date:
October 15, 2014
Export Citation:
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Assignee:
FUJITSU LTD
International Classes:
G06F7/58; G09C1/00; H03K3/84
Domestic Patent References:
JP2014075082A2014-04-24
JP2014075082A2014-04-24
Foreign References:
Other References:
ELAINE BAKER: "Recommendation for the Entropy Sources Used for Random Bit Genetration", COMPUTER SECURITY, JPN6018006850, August 2012 (2012-08-01), US, pages 1-80頁
ELAINE BAKER: "Recommendation for the Entropy Sources Used for Random Bit Genetration", COMPUTER SECURITY, JPN6018006850, August 2012 (2012-08-01), US, pages 1-80頁
Attorney, Agent or Firm:
Atsushi Aoki
Koichi Itsubo
Tsutomu Kono
Tetsuo Miyamoto