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Patent Searching and Data


Title:
SAMPLE-SUPPORT STAND FOR INSTRUMENTAL ANALYSIS
Document Type and Number:
Japanese Patent JPH07120365
Kind Code:
A
Abstract:

PURPOSE: To increase the speed of an analysis by using a sample-support stand provided with a plurality of rotatable sample-support substands.

CONSTITUTION: For example, 15 pieces of sample-support substands are installed on a sample-support stand having a diameter of 150mm. Every sample-support substand has a shape formed by cutting off one end of a steel ball, and a sample which has been melted by an EB(electron beam) is fixed to a horizontal part with a conductive adhesive. After the sample has been set, every sample-support substand is fixed to a recessed part in the support stand by a fixing screw in such a way that a raft is made to face in a direction along an electron beam is made incident. The required area of the sample-support substand is changed according to the shape of the sample after the sample has been melted by the EB, and the area of 1.5cm2 or larger is required for practical use because, in an EB method, the amount of the sample to be melted of 1 to 3g is a proper amount. When the sample-support stand is used, the time for an analysis is shortened remarkably, the number of revolutions of the support stand during the analysis is reduced, and the degree of the exfoliation of the sample is reduced.


Inventors:
NAKAJIMA JUNJI
OONUKI KAZUO
SUZUKI SHUNICHI
Application Number:
JP1993000263578
Publication Date:
May 12, 1995
Filing Date:
October 21, 1993
Export Citation:
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Assignee:
NIPPON STEEL CORP
International Classes:
G01N1/28; G01N33/20; (IPC1-7): G01N1/28; G01N33/20
Attorney, Agent or Firm:
矢葺 知之 (外1名)