To achieve a semiconductor integrated circuit and its test method which can facilitate the decision of the quality of an analog integrated circuit in a test of the semiconductor integrated circuit including the analog integrated circuit.

The semiconductor integrated circuit 1 including the analog integrated circuit 2 is arranged. A DC level decision circuit 3 is disposed in order to decide as to whether or not a DC voltage at a specific circuit node of the analog integrated circuit 2 is in a certain range. A decision result outputting terminal 4 is disposed in order to output a result of the DC level decision circuit 3 to the outside.