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Title:
SPACE ENVIRONMENT TEST DEVICE
Document Type and Number:
Japanese Patent JPH08104300
Kind Code:
A
Abstract:

PURPOSE: To provide a space environment test device which prevents the occurrence of a normal temperature surface which causes a test error in a test environment space by the effective utilization of a space in a vacuum vessel and makes a test piece possible to carry in a by the application of load on a work scaffold without necessitating the troublesome work.

CONSTITUTION: In a space environment test device provided with a heat wall (shroud 12) which keeps the inside of a vacuum vessel 11 at an very low temperature on an inner periphery of the vacuum vessel 11, a substantially horizontal floor section 13 which is cooled to the same temperature as that of the shroud 12 is provided in the vacuum vessel 11 in such a manner that it has a highly rigid structure which can withstand load of a test piece 14 and worker sufficiently.


Inventors:
TSUKAMOTO IKUO
Application Number:
JP1994000238815
Publication Date:
April 23, 1996
Filing Date:
October 03, 1994
Export Citation:
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Assignee:
NIPPON OXYGEN CO LTD
International Classes:
B64G7/00; (IPC1-7): B64G7/00
Attorney, Agent or Firm:
Kazuhiko Kido (1 person outside)



 
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