Title:
超高質量範囲質量分析計システム
Document Type and Number:
Japanese Patent JP2008515169
Kind Code:
A
Abstract:
Applicant's present invention comprises mass spectrometer systems that operate in a mass range from 1 to 1016 DA. The mass spectrometer system comprising an inlet system comprising an aerodynamic lens system, a reverse jet being a gas flux generated in an annulus moving in a reverse direction and a multipole ion guide; a digital ion trap; and a thermal vaporization/ionization detector system. Applicant's present invention further comprises a quadrupole mass spectrometer system comprising an inlet system having a quadrupole mass filter and a thermal vaporization/ionization detector system. Applicant's present invention further comprises an inlet system for use with a mass spectrometer system, a method for slowing energetic particles using an inlet system. Applicant's present invention also comprises a detector device and a method for detecting high mass charged particles.
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Inventors:
Rayleigh, Peter T. A.
Application Number:
JP2007534828A
Publication Date:
May 08, 2008
Filing Date:
September 30, 2005
Export Citation:
Assignee:
Utility-Batel LLC
International Classes:
H01J49/06; G01N27/62; H01J41/04; H01J49/04; H01J49/26
Attorney, Agent or Firm:
Hironobu Onda
Makoto Onda
Makoto Onda