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Patent Searching and Data


Title:
SURFACE PROFILE MEASURING EQUIPMENT
Document Type and Number:
Japanese Patent JPH08219734
Kind Code:
A
Abstract:

PURPOSE: To measure the surface profile of any object accurately regardless of the surface properties thereof by providing slits, corresponding in number to the identifiers, at each opening.

CONSTITUTION: A slit plate 4 is provided with different number of slits (s) at each opening E1-E4 for passing laser light through a lens and the number of slits represents the identifier at that opening. A laser light entering each opening is split by the number of slits thereat and then converted through an photoelectric converter into measurement pulse signal r1-r4. Each measurement pulse signal r1-r4 is inputted to a signal processing circuit at a timing shown on the figure. Number of slits (s) is pre-stored in the signal processing circuit for each opening E1-E4. When pre-stored number of pulse signals are not inputted, it is decided that the measurement failed at the measuring point corresponding to that number and a predetermined abnormality processing can be carried out.


Inventors:
NOZAWA MASAHITO
SAMEDA YOSHITOMI
Application Number:
JP2549995A
Publication Date:
August 30, 1996
Filing Date:
February 14, 1995
Export Citation:
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Assignee:
TOSHIBA CORP
International Classes:
G01B11/24; G01N13/10; G01N37/00; G01S7/497; G01S17/08; H01J37/28; (IPC1-7): G01B11/24; G01N37/00; G01S17/08; H01J37/28
Attorney, Agent or Firm:
Kazuo Sato (3 others)