Title:
SYSTEM OF SCRUBBING POWER SOURCE WITH RESPECT TO SWITCHING FAULT
Document Type and Number:
Japanese Patent JP3660024
Kind Code:
B2
Abstract:
PURPOSE: To test a potential fault in a power mixing device by providing first and second power rail and the power mixing device in a circuit module.
CONSTITUTION: The first power rail 30 of a circuit 10 is connected to the input of a DC controller(DCC) 32 through a first fuse 34, a first power path transistor 36 and a first isolation diode 38 which are mutually serially connected. Similarly a second power rail 40 is connected to the input of DCC 32 through a second fuse 44, a second power path transistor 46 and a second isolation diode 48 which are mutually serially connected. In addition a first test circuit 80 is provided with a first test opto-isolator 82 and its control input is connected to a first test node 84 arranged between the drain of a first power path N-channel MOS transistor 36 and the cathode of the first isolation diode 38. Consequently, a potential fault test is made possible at the power mixing device.
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Inventors:
David El Old Ridge
William Pea Banton
Stephen Earl Bisel
David Brown
Daniel Degan
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David Peasonia
William Pea Banton
Stephen Earl Bisel
David Brown
Daniel Degan
Curl cargie
David Peasonia
Application Number:
JP16185895A
Publication Date:
June 15, 2005
Filing Date:
June 28, 1995
Export Citation:
Assignee:
TANDEM COMPUTERS INCORPORATED
International Classes:
H02J9/00; G01R31/28; G01R31/40; G05F1/00; G06F11/20; H02J1/00; H02J9/06; G06F11/00; (IPC1-7): G05F1/00; H02J9/00
Domestic Patent References:
| JP1318506A |
Foreign References:
| US5325062 |
Attorney, Agent or Firm:
Minoru Nakamura
Fumiaki Otsuka
Shishido Kaichi
Hideto Takeuchi
Toshio Imajo
Nobuo Ogawa
Village shrine Atsuo
Fumiaki Otsuka
Shishido Kaichi
Hideto Takeuchi
Toshio Imajo
Nobuo Ogawa
Village shrine Atsuo