Title:
TARGET, METHOD AND APPARATUS FOR MEASURING ASSEMBLY AND ALIGNMENT ERRORS IN SENSOR ASSEMBLY
Document Type and Number:
Japanese Patent JP2004208299
Kind Code:
A
Abstract:
To provide a target, method and apparatus for measuring assembly and alignment errors in a scanner sensor assembly.
A target (601) for measuring assembly and alignment errors in multi-segment sensor assemblies (501, 502, 503) is provided with (a) a background (609), (b) at least two marks (602, 603, 604) each of which is disposed to be detected only by one segment of the multi-segment sensor assemblies (501, 502, 503) in comparison with the background (609), and (c) operating vertical edges (605, 606, 607) on the respective marks (602, 603, 604).
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Inventors:
HARRIS RODNEY C
SPEARS KURT E
SPEARS KURT E
Application Number:
JP2003417688A
Publication Date:
July 22, 2004
Filing Date:
December 16, 2003
Export Citation:
Assignee:
HEWLETT PACKARD DEVELOPMENT CO
International Classes:
H04N1/028; H04N1/047; H04N1/10; H04N1/193; (IPC1-7): H04N1/028
Attorney, Agent or Firm:
Shoichi Okuyama
Arihara Koichi
Matsushima Tetsuo
Hidefumi Kawamura
Arihara Koichi
Matsushima Tetsuo
Hidefumi Kawamura