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Patent Searching and Data


Title:
X-RAY INSPECTION DEVICE
Document Type and Number:
Japanese Patent JP2021124394
Kind Code:
A
Abstract:
To provide an X-ray inspection device that can easily grasp the presence of foreign material in any region of an inspection target object.SOLUTION: An X-ray inspection device 1 has a controller 10. The controller 10 generates an X-ray image from the result of detection of an X-ray passing through an item G and processes the generated X-ray image. The controller 10 virtually divides the item G shown on an X-ray image into regions of the item G, inspects each region of the X-ray image, and records the result of inspection of each region in relation to region information of the region.SELECTED DRAWING: Figure 1

Inventors:
KUDO DAISUKE
IKEDA ATSUSHI
YAMAMOTO YOICHI
TODORI MICHIHIKO
SUGIMOTO KAZUYUKI
Application Number:
JP2020018152A
Publication Date:
August 30, 2021
Filing Date:
February 05, 2020
Export Citation:
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Assignee:
ISHIDA SEISAKUSHO
International Classes:
G01N23/18; G01N23/04; G01N23/087
Attorney, Agent or Firm:
Yoshiki Hasegawa
Yoshiki Kuroki
Makoto Takaguchi
Arai Tohio