Title:
MATERIAL TESTING DEVICE
Document Type and Number:
Japanese Patent JPH0755674
Kind Code:
A
Abstract:
PURPOSE: To observe cracks and peeling in a test piece at high sensitivity during a test, irrespective of their directions.
CONSTITUTION: An ultrasonic wave is transmitted via d water bag 12 from an ultrasonic probe 9 disposed parallel to a test piece 2 to which a load is applied, and the reflected ultrasonic wave is received to display a tomogram of the test piece 2 in a display 11. Since ultrasonic flaw detection is carried out in this way, the sensitivity for cracks and peeling in a direction perpendicular to the direction of transmission of the ultrasonic wave is enhanced as compared with those of conventional X-ray material testing devices, and in-depth sensitivity is also enhanced.
Inventors:
MAEDA TOYOICHI
Application Number:
JP20612493A
Publication Date:
March 03, 1995
Filing Date:
August 20, 1993
Export Citation:
Assignee:
SHIMADZU CORP
International Classes:
G01N3/32; G01N29/04; (IPC1-7): G01N3/32; G01N29/10
Attorney, Agent or Firm:
Kazuhide Okada