Title:
METHOD FOR MEASURING DEGRADATION OF CRYSTALLINE POLYMER
Document Type and Number:
Japanese Patent JP2018100943
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a method for measuring degradation of a crystalline polymer, the method allowing detection of the degradation of a crystalline polymer in an initial stage.SOLUTION: The method for measuring degradation of a crystalline polymer includes the steps of: measuring a Raman spectrum of a crystalline polymer; and comparing the measured Raman spectrum and the Raman spectrum of a regular sample and measuring the peak shift of a predetermined peak caused by a precursor phenomenon in which a part of the amorphous phases in the lamella structure of the crystalline polymer is going to crystallize.SELECTED DRAWING: Figure 1
Inventors:
NITTA KOHEI
HIEJIMA YUSUKE
IGARASHI TOSHIRO
KIDA TAKUMITSU
TAKEDA TAKETO
HIEJIMA YUSUKE
IGARASHI TOSHIRO
KIDA TAKUMITSU
TAKEDA TAKETO
Application Number:
JP2016248326A
Publication Date:
June 28, 2018
Filing Date:
December 21, 2016
Export Citation:
Assignee:
UNIV KANAZAWA
International Classes:
G01N21/65
Domestic Patent References:
| JP2016204620A | 2016-12-08 | |||
| JP2006084261A | 2006-03-30 | |||
| JP2004083604A | 2004-03-18 | |||
| JP2007179026A | 2007-07-12 |
Foreign References:
| US4303763A | 1981-12-01 | |||
| US20150274908A1 | 2015-10-01 | |||
| US6048607A | 2000-04-11 | |||
| WO1998004600A1 | 1998-02-05 | |||
| WO1999027350A1 | 1999-06-03 |
Other References:
古屋中 茂樹 他: "ラマン分光法によるプラスチック素材の判定法の検討", 粉体工学会誌, vol. 39, no. 3, JPN6020021800, 2002, JP, pages 190 - 195, ISSN: 0004292950
内田 克己 他: "高電界劣化ポリエチレンの微視的および化学的構造", 電学論Ａ, vol. 111巻11号, JPN6020021801, 1991, pages 1007 - 1012, ISSN: 0004292951
内田 克己 他: "高電界劣化ポリエチレンの微視的および化学的構造", 電学論Ａ, vol. 111巻11号, JPN6020021801, 1991, pages 1007 - 1012, ISSN: 0004292951
Attorney, Agent or Firm:
Sumio Tanai
Masato Iida
Nishizawa Kazumi
Shiro Suzuki
Ryo Tsuchiya
Masato Iida
Nishizawa Kazumi
Shiro Suzuki
Ryo Tsuchiya