Title:
【発明の名称】テストパタン生成装置
Document Type and Number:
Japanese Patent JP3055309
Kind Code:
B2
Abstract:
PURPOSE:To offer a method of preparing test patterns which is capable of reproducing operations of a parts mounting machine only through fine adjustment, wherein the test pattern prepared by a test pattern preparing device is approached to the operation of the mounting machine. CONSTITUTION:Each terminal of an IC 2 mounted on a parts mounting machine 1 undergoes probing. Signal at a clock terminal 5 is taken in a counter 6, which counts pulses at the clock terminal 5, the result being emitted on the real time basis. A logic analyzer 3 takes in the output of the counter 6 and the logical level of IC terminal through sampling process. On the basis of the data sampled, a conversion device 4 calculates the number of patterns from the output data of the counter 6, combines with the data of the logical level at the IC terminal, and produces a test pattern. Because of possibility of preparing test pattern near the operation of the mounting machine, a test pattern which can reproduce the operation of the mounting machine can be achieved easily.
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Inventors:
Mikio Saito
Application Number:
JP17018792A
Publication Date:
June 26, 2000
Filing Date:
June 04, 1992
Export Citation:
Assignee:
NEC
International Classes:
G01R13/28; G01R31/28; G01R31/319; G06F11/22; G01R31/3183; (IPC1-7): G01R31/3183; G01R13/28; G01R31/319; G06F11/22
Domestic Patent References:
| JP3277984A | ||||
| JP2206771A | ||||
| JP51102689A | ||||
| JP58205860A | ||||
| JP5995473A | ||||
| JP59153174A | ||||
| JP61133867A | ||||
| JP6391570A | ||||
| JP63186153A | ||||
| JP6438663A |
Attorney, Agent or Firm:
Naka Kanno