Title:
ABNORMALITY DETECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2023/286175
Kind Code:
A1
Abstract:
The abnormality detection device according to one embodiment is an abnormality detection device for detecting an abnormality in a rolling system for rolling a material according to a prescribed process, the abnormality detection device comprising a pre-process feature determination unit for determining whether or not the material prior to the prescribed process satisfies a prescribed feature, a post-process feature determination unit for determining whether or not the material after the prescribed process satisfies the prescribed feature, an intervention manipulated variable extraction unit for extracting a manipulated variable of an intervention by an operator with respect to the prescribed process, a determination unit for determining that an abnormality has occurred in the prescribed process when at least the post-process feature determination unit has determined that the prescribed feature is satisfied and the manipulated variable extracted by the intervention manipulated variable extraction unit exceeds a predetermined manipulated variable, and an output unit for outputting a result determined by the determination unit.
Inventors:
HANDA SATOSHI (JP)
Application Number:
PCT/JP2021/026347
Publication Date:
January 19, 2023
Filing Date:
July 13, 2021
Export Citation:
Assignee:
TOSHIBA MITSUBISHI ELEC IND (JP)
International Classes:
B21B38/00; G05B23/02
Foreign References:
| JP2004167604A | 2004-06-17 | |||
| JP2019181483A | 2019-10-24 | |||
| JPH11347614A | 1999-12-21 |
Attorney, Agent or Firm:
TAKADA, TAKAHASHI & PARTNERS (JP)
Download PDF: