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Title:
ABNORMALITY ESTIMATION DEVICE, ABNORMALITY DETECTION DEVICE, ABNORMALITY DETECTION METHOD, AND ABNORMALITY DETECTION PROGRAM
Document Type and Number:
WIPO Patent Application WO/2021/024351
Kind Code:
A1
Abstract:
Provided is an abnormality detection device that is capable of acquiring an abnormality degree required for detecting an abnormality even when a feature pattern of chronological data changes as time elapses. The abnormality detection device detects an abnormality degree in chronological data. The abnormality detection device is provided with a first acquisition unit, a prediction unit, and an abnormality degree acquisition unit. The first acquisition unit acquires a dynamic feature pattern of a first segment from a first segment that is a partial segment of chronological data. The prediction unit uses the feature pattern to predict data from a second segment that is a partial segment of the chronological data subsequent to the first segment and acquires predicted second segment data. The abnormality degree acquisition unit acquires an abnormality degree on the basis of the difference between the predicted second segment data and the actual data of the second segment in the chronological data.

Inventors:
ITO HIROAKI (JP)
MURATA SHIN (JP)
Application Number:
PCT/JP2019/030717
Publication Date:
February 11, 2021
Filing Date:
August 05, 2019
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Assignee:
NIPPON TELEGRAPH & TELEPHONE (JP)
International Classes:
G07C5/00
Foreign References:
JP2006135412A2006-05-25
JP2005094361A2005-04-07
JP2005128808A2005-05-19
JPH08320721A1996-12-03
JP2009111537A2009-05-21
Attorney, Agent or Firm:
NAKAO, Naoki et al. (JP)
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