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Patent Searching and Data


Title:
ABNORMALITY MONITORING DEVICE, ABNORMALITY MONITORING METHOD, AND ABNORMALITY MONITORING PROGRAM
Document Type and Number:
WIPO Patent Application WO/2022/162806
Kind Code:
A1
Abstract:
An abnormality monitoring device 3 comprises: a learned model Md that is generated on the basis of a learning image created by capturing a dividing part of a mold at a plurality of prescribed positions around the dividing part of the mold; a first camera 71 that captures the dividing part at a first position around the dividing part to acquire a first captured image Im1; a second camera 72 that captures the dividing part at a second position around the dividing part to acquire a second captured image; and a control unit 81 that inputs each of the first captured image Im1 and the second captured image Im2 to the learned model Md to calculate an evaluation value, determines that the dividing part is in an abnormal state when the evaluation value falls within a prescribed range, and outputs stop instructions St to stop mold clamping.

Inventors:
KAMEOKA Yo (TH)
FUJII Hiroshi (TH)
HARA Yasuhiko (JP)
Application Number:
PCT/JP2021/002919
Publication Date:
August 04, 2022
Filing Date:
January 27, 2021
Export Citation:
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Assignee:
RYOYO ELECTRO CORPORATION (JP)
International Classes:
B29C45/26; B29C45/84; G06N20/00
Attorney, Agent or Firm:
AXIS PATENT INTERNATIONAL (JP)
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