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Patent Searching and Data


Title:
ANALYSIS DEVICE, ANALYSIS SYSTEM, AND ANALYSIS METHOD
Document Type and Number:
WIPO Patent Application WO/2022/118412
Kind Code:
A1
Abstract:
The present invention is characterized by comprising: a transport unit (202) that transports a bag (B) that is an inspection target that efficiently collects fine particles from the inspection target; a nozzle that injects compressed air for separating the fine particles attached to the bag (B); a collection unit (130) that collects the fine particles separated from the bag (B) by the compressed air injected from the nozzle; and an analysis unit (150) that analyzes the fine particles collected by the collection unit (130), wherein the compressed air is continuously or intermittently injected from the nozzle before the bag (B) reaches the nozzle, and a state in which the compressed air is injected by the nozzle continues until at least the bag (B) passes through the front side of the nozzle.

Inventors:
TAKADA YASUAKI (JP)
SUGAYA MASAKAZU (JP)
KASHIMA HIDEO (JP)
KUMANO SHUN (JP)
SHISHIKA TSUKASA (JP)
YOSHIOKA SHINJI (JP)
Application Number:
PCT/JP2020/044917
Publication Date:
June 09, 2022
Filing Date:
December 02, 2020
Export Citation:
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Assignee:
HITACHI HIGH TECH CORP (JP)
International Classes:
G01N1/02; G01N15/00
Domestic Patent References:
WO2014045649A12014-03-27
WO2011024293A12011-03-03
WO2017209065A12017-12-07
Foreign References:
JP2020183913A2020-11-12
US20120278002A12012-11-01
Attorney, Agent or Firm:
ISONO INTERNATIONAL PATENT OFFICE, P.C. (JP)
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