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Title:
APPARATUS, METHOD AND SYSTEM FOR MEASURING PROMPT GAMMA AND OTHER BEAM-INDUCED RADIATION DURING HADRON THERAPY TREATMENTS FOR DOSE AND RANGE VERIFICATON PURPOSES USING IONIZATION RADIATION DETECTION
Document Type and Number:
WIPO Patent Application WO/2011/143367
Kind Code:
A3
Abstract:
An apparatus, method and system for measurement of radiation during or directly following hadron therapy treatment for dose and range verification purposes accomplished through measurement of prompt gamma and other beam-induced radiation. One example includes the measurement of secondary prompt gamma radiation during proton and carbon ion beam irradiation. The measurement can also be made of other beam-induced radiation results. The measurement of gamma radiation or other beam- induced radiation allows for optimization of radiation dose disposition to the target tissue, with improved sparing of surrounding critical structures and normal tissue. Adjustments to a radiation treatment may be made as needed based on actual and measured applied dosages.

Inventors:
BUTUCEANU CORNEL (US)
BAILLIE NATHAN (US)
KEPPEL CYNTHIA E (US)
Application Number:
PCT/US2011/036150
Publication Date:
March 01, 2012
Filing Date:
May 11, 2011
Export Citation:
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Assignee:
HAMPTON UNIVERSITY OFFICE OF GENERAL COUNSEL (US)
BUTUCEANU CORNEL (US)
BAILLIE NATHAN (US)
KEPPEL CYNTHIA E (US)
International Classes:
A61N5/10; G01T1/161
Domestic Patent References:
WO2008119777A12008-10-09
WO2007013869A12007-02-01
WO2008087952A12008-07-24
Foreign References:
US20060203967A12006-09-14
Other References:
See also references of EP 2569054A4
Attorney, Agent or Firm:
GROSS, Charles, J. (1750 Tysons Boulevard Suite 180, McLean VA, US)
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