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Title:
AUTOMATIC EXPOSURE SELECTION METHOD FOR HIGH DYNAMIC RANGE 3D OPTICAL MEASUREMENTS
Document Type and Number:
WIPO Patent Application WO/2022/147670
Kind Code:
A1
Abstract:
The present invention provides an automatic exposure selection method for high dynamic range 3D optical measurements, comprising: capturing a single query image under a default exposure; in the k th exposure selection, capturing a plurality of phase-coded images I k under an exposure t k ; calculating a binary mask image M k according to the phase-coded image I k ; calculating a filtered images I k updated according to the binary mask image M k and the phase-coded image I k ; calculating an image quality metric Q k new of the k th exposure based on the filtered images I k updated ; judging whether a number of pixels meet a threshold according to the filtered images I k updated , if yes, going to the next step, if not, continuing a next exposure t k+1 until it meets; conducting image fusion to pixel-wisely choose pixels from images taken under multiple exposures (t 1 , t 2 , …). The invention has small measurement error and high measurement accuracy.

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Inventors:
GE JI (CN)
LIU XINGJIAN (CN)
CHEN WENYUAN (CN)
SUN YU (CA)
Application Number:
PCT/CN2021/070384
Publication Date:
July 14, 2022
Filing Date:
January 06, 2021
Export Citation:
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Assignee:
JIANGSU JITRI MICRO NANO AUTOMATION INST CO LTD (CN)
International Classes:
G06T5/00
Foreign References:
CN110390645A2019-10-29
CN110211053A2019-09-06
CN111708032A2020-09-25
CN101301200A2008-11-12
US20190387215A12019-12-19
US20140007025A12014-01-02
Attorney, Agent or Firm:
CENTRAL SOUTH WELL INTELLECTUAL PROPERTY OFFICE (CN)
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