BACK-SCATTERING INSPECTION SYSTEM AND BACK-SCATTERING INSPECTION METHOD

Title:

BACK-SCATTERING INSPECTION SYSTEM AND BACK-SCATTERING INSPECTION METHOD

Document Type and Number:

WIPO Patent Application WO/2020/140982

Kind Code:

A1

Abstract:

A back-scattering inspection system and a back-scattering inspection method. The back-scattering inspection system comprises a rack (1) and a back-scattering inspection device (2). The rack (1) comprises tracks arranged vertically or obliquely with respect to the ground, and the space enclosed by the tracks forms an inspection passage. The back-scattering inspection device (2) comprises a back-scattering ray-emitting device (3) and a back-scattering detector (4), and the back-scattering inspection device (2) is movably arranged on the tracks and is used for inspecting an inspected object passing through the inspection passage. The back-scattering inspection system can perform back-scattering inspection on a plurality of surfaces of the inspected object.

Inventors:

LI JIANMIN (CN)
ZHANG LI (CN)
LI YUANJING (CN)
CHEN ZHIQIANG (CN)
YU HAO (CN)
SUN SHANGMIN (CN)
LIU BICHENG (CN)
WANG WEIZHEN (CN)
WANG DONGYU (CN)
MA YUAN (CN)
HU YU (CN)
ZONG CHUNGUANG (CN)

Application Number:

PCT/CN2020/070317

Publication Date:

July 09, 2020

Filing Date:

January 03, 2020

Export Citation:

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Assignee:

UNIV TSINGHUA (CN)
NUCTECH CO LTD (CN)
NUCTECH BEIJING COMPANY LTD (CN)

International Classes:

G01N23/20008; G01N23/203

Foreign References:

CN109613031A	2019-04-12
CN209542493U	2019-10-25
CN104101910A	2014-10-15
CN105784737A	2016-07-20
JP2008180651A	2008-08-07
CN206056502U	2017-03-29

Other References: