Title:
BEAM MEASUREMENT METHOD IN ELECTRONIC DEVICE, AND ELECTRONIC DEVICE
Document Type and Number:
WIPO Patent Application WO/2021/045592
Kind Code:
A1
Abstract:
According to various embodiments, an electronic device may comprise: a plurality of antenna modules each including a plurality of antenna elements, the antenna modules being spaced apart from each other; and a processor configured to communicate with a base station by a first reception beam formed through a first antenna module among the plurality of antenna modules, while communicating with the base station through the first antenna module, when a reception signal measurement period of a second reception beam, which is formed through a second antenna module among the plurality of antenna modules, arrives, identify a third reception beam, which can be formed through the first antenna module, in response to coverage of the second reception beam, and determine a result of measurement of the second reception beam on the basis of a result of measurement of a reference signal received by the third reception beam. Various other embodiments are possible.
Inventors:
PARK DAEHEE (KR)
SEO CHONGHWA (KR)
SEO CHONGHWA (KR)
Application Number:
PCT/KR2020/012031
Publication Date:
March 11, 2021
Filing Date:
September 07, 2020
Export Citation:
Assignee:
SAMSUNG ELECTRONICS CO LTD (KR)
International Classes:
H04B7/0408; H04B7/08; H04B17/318; H04L5/00
Domestic Patent References:
| WO2016186378A1 | 2016-11-24 |
Foreign References:
| KR20190007465A | 2019-01-22 | |||
| KR101543142B1 | 2015-08-07 | |||
| US20180323852A1 | 2018-11-08 | |||
| KR20170085426A | 2017-07-24 |
Attorney, Agent or Firm:
LEE, Keon-Joo et al. (KR)
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