CAPACITANCE TESTING CIRCUIT AND ELECTRONIC DEVICE

WIPO Patent Application WO/2018/126490

A1

A capacitance testing circuit (12, 22, 32, 52), comprising multiple electrodes (RX_0, RX_1, RX_2 … RX_N) for transmitting multiple electrode signals (R0, R1, R2 … RN); one or more differential amplifiers (Amp_0, Amp_1, Amp_2 … Amp_K) for generating multiple differential output signals (Out0, Out1, Out2 …), wherein each of the differential amplifiers (Amp_0, Amp_1, Amp_2 … Amp_K) has a first input end and a second input end; and a recovery module (120, 220, 320, 520) for generating, according to the multiple differential output signals (Out0, Out1, Out2 …), multiple recovery signals (R0', R1', R2' … RN') corresponding to the multiple electrode signals (R0, R1, R2 … RN), wherein the first input end of one differential amplifier of the one or more differential amplifiers (Amp_0, Amp_1, Amp_2 … Amp_K) is coupled to multiple first electrodes of the multiple electrodes (RX_0, RX_1, RX_2 … RX_N), and the second input end of the differential amplifier is coupled to multiple second electrodes of the multiple electrodes (Amp_0, Amp_1, Amp_2 … Amp_K).

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WEN YA-NAN (CN)
LIANG YINGSI (CN)

PCT/CN2017/070683

July 12, 2018

January 09, 2017

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SHENZHEN HUIDING TECHNOLOGY CO (CN)

G06F3/044

CN105283827A	2016-01-27
US20110037708A1	2011-02-17
CN106020559A	2016-10-12
CN104750330A	2015-07-01

SHANGHAI CHENHAO INTELLECTUAL PROPERTY LAW FIRM GENERAL PARTNERSHIP (CN)

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