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Title:
CAVITY LENGTH MEASUREMENT DEVICE FOR MICROWAVE RESONANT CAVITY AND SENSOR
Document Type and Number:
WIPO Patent Application WO/2019/029193
Kind Code:
A1
Abstract:
A cavity length measurement device for a microwave resonant cavity, and a sensor. The cavity length measurement device comprises: a microwave resonant cavity, and a demodulating equipment. The microwave resonant cavity includes a hollow core coaxial cable-fabry-perot resonant cavity (5), a first reflection point (3), and a second reflection point (4); the first reflection point (3) is disposed at a first location within the hollow core coaxial cable-fabry-perot resonant cavity (5); the second reflection point (4) is disposed at a second location within the hollow core coaxial cable-fabry-perot resonant cavity (5); a movement may occur on the first location and/or the second location. The reflectivity of the first reflection point (3) and the second reflection point (4) is greater than or equal to a preset threshold. The demodulating equipment is connected to the microwave resonant cavity to analyze microwave signals in the microwave resonant cavity, so as to obtain the cavity length of the microwave resonant cavity, the cavity length of the microwave resonant cavity being a distance between the first reflection point and the second reflection point.

Inventors:
CHEN YIZHENG (CN)
HUANG JIE (CN)
TANG YAN (CN)
CHEN CHANGLIN (CN)
Application Number:
PCT/CN2018/084360
Publication Date:
February 14, 2019
Filing Date:
April 25, 2018
Export Citation:
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Assignee:
JIANGSU HONGKAI SENSING TECH LLC (CN)
International Classes:
G01D5/26; G02F2/00
Foreign References:
CN207600488U2018-07-10
CN103697922A2014-04-02
CN102539013A2012-07-04
CN1575405A2005-02-02
CN102169027A2011-08-31
CN105788749A2016-07-20
EP1235086A22002-08-28
US20050244096A12005-11-03
Other References:
ZHANG PENG ET AL.: "Demodulation of the Optical Fiber Fabry-Perot Sensor Based on Fourier Transform", ACTA OPTICA SINICA, 28 February 2005 (2005-02-28), pages 186 - 189, ISSN: 0253-2239
Attorney, Agent or Firm:
CHINA PAT INTELLECTUAL PROPERTY OFFICE (CN)
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