Title:
CHARGED PARTICLE EMISSION CONTROL DEVICE, METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2021/002354
Kind Code:
A1
Abstract:
The present invention provides charged particle emission control technology by which slow extraction of a charged particle beam from a synchrotron can be stably performed even in a state where beam adjustment is not performed or has not been completed. A charged particle emission control device (10) is provided with: a first reception unit (11) that receives a first detection signal (S1) obtained by detecting the current value of charged particles cycling in a synchrotron (20); an arithmetic processing unit (16) that temporally differentiates the first detection signal (S1) and outputs a beam intensity-equivalent value (D); and an emission control unit (18) that outputs a control signal (G) for emitting a charged particle beam (51) from the synchrotron (20) to a beam transport system (30) such that the beam intensity-equivalent value (D) matches a target value (17).
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Inventors:
KOTAKI KOHEI (JP)
MATSUMOTO MUNEMICHI (JP)
FURUKAWA TAKUJI (JP)
MIZUSHIMA KOTA (JP)
MATSUMOTO MUNEMICHI (JP)
FURUKAWA TAKUJI (JP)
MIZUSHIMA KOTA (JP)
Application Number:
PCT/JP2020/025650
Publication Date:
January 07, 2021
Filing Date:
June 30, 2020
Export Citation:
Assignee:
TOSHIBA ENERGY SYSTEMS & SOLUTIONS CORP (JP)
NATIONAL INSTITUTES FOR QUANTUM AND RADIOLOGICAL SCIENCE AND TECH (JP)
NATIONAL INSTITUTES FOR QUANTUM AND RADIOLOGICAL SCIENCE AND TECH (JP)
International Classes:
H05H13/04; A61N5/10
Domestic Patent References:
| WO2011107120A1 | 2011-09-09 |
Foreign References:
| JP2010251106A | 2010-11-04 | |||
| JP2012234653A | 2012-11-29 | |||
| JP2014170714A | 2014-09-18 | |||
| JP2018189465A | 2018-11-29 |
Attorney, Agent or Firm:
TOKYO INTERNATIONAL PATENT FIRM (JP)
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