Title:
COATED SUPER-ABRASIVE GRAIN, ABRASIVE GRAIN, AND WHEEL
Document Type and Number:
WIPO Patent Application WO/2021/025015
Kind Code:
A1
Abstract:
A coated super-abrasive grain comprises an abrasive grain body composed of cubic boron nitride, and a coating film coating at least a part of the surface of the abrasive grain body. The dislocation density of the abrasive grain body is less than or equal to 9×1014/m2, and the coating film contains one or more kinds of compounds composed of at least one kind of element selected from the group consisting of group 4 elements, group 5 elements, group 6 elements, aluminum and silicon, and at least one kind of element selected from the group consisting of oxygen, nitrogen, carbon and boron in the periodic table.
Inventors:
ISHII AKITO (JP)
OKAMURA KATSUMI (JP)
OHATA MASAHIRO (JP)
MICHIUCHI MASATO (JP)
HIRAI KEI (JP)
NAKAMURA NOBUHIDE (JP)
CHIHARA KENTARO (JP)
OKAMURA KATSUMI (JP)
OHATA MASAHIRO (JP)
MICHIUCHI MASATO (JP)
HIRAI KEI (JP)
NAKAMURA NOBUHIDE (JP)
CHIHARA KENTARO (JP)
Application Number:
PCT/JP2020/029807
Publication Date:
February 11, 2021
Filing Date:
August 04, 2020
Export Citation:
Assignee:
SUMITOMO ELECTRIC INDUSTRIES (JP)
ALMT CORP (JP)
ALMT CORP (JP)
International Classes:
B24D3/00; B24D5/00
Foreign References:
JP2000158347A | 2000-06-13 | |||
JP2014040589A | 2014-03-06 | |||
JPS62176769A | 1987-08-03 | |||
JP2005262355A | 2005-09-29 | |||
JP2013154440A | 2013-08-15 | |||
JPH0931442A | 1997-02-04 | |||
JP2002137168A | 2002-05-14 | |||
JP2019144242A | 2019-08-29 | |||
JP2002137168A | 2002-05-14 |
Other References:
T. UNGARA. BORBELY: "The effect of dislocation contrast on x-ray line broadening: A new approach to line profile analysis", APPL. PHYS. LETT., vol. 69, no. 21, 1996, pages 3173, XP012016627, DOI: 10.1063/1.117951
T. UNGARS. OTTP. SANDERSA. BORBELYJ. WEERTMAN: "Dislocations, grain size and planar faults in nanostructured copper determined by high resolution X-ray diffraction and a new procedure of peak profile analysis", ACTA MATER., vol. 46, no. 10, 1998, pages 3693 - 3699, XP027395830
T. UNGARS. OTTP. SANDERSA. BORBELYJ. WEERTMAN: "Dislocations, grain size and planar faults in nanostructured copper determined by high resolution X-ray diffraction and a new procedure of peak profile analysis", ACTA MATER., vol. 46, no. 10, 1998, pages 3693 - 3699, XP027395830
Attorney, Agent or Firm:
FUKAMI PATENT OFFICE, P.C. (JP)
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