Title:
CONTACTLESS X-RAY INSPECTION DEVICE AND ITEM INSPECTION METHOD THEREFOR
Document Type and Number:
WIPO Patent Application WO/2021/002492
Kind Code:
A1
Abstract:
The present invention relates to a contactless X-ray inspection device and an item inspection method therefor. The contactless X-ray inspection device comprises: at least one tray transport path on which a tray (16) having at least one item (BI), to be inspected, loaded thereon can be transported; X-ray inspection modules (14a, 14b, 15a, 15b) provided at inspection locations (IP1, IP2) formed on the transport path; and position detection units (AS1, AS2) for detecting position information of the tray (16) or the item (BI) to be inspected, wherein inspection is performed by the inspection modules (14a, 14b, 15a, 15b) when the tray (16) is aligned at the inspection locations (IP1, IP2).
Inventors:
KIM HYEONG-CHEOL (KR)
SON GYEONG-SEON (KR)
LEE TAE-YUN (KR)
LEE JAE-DONG (KR)
GO YOUNG-BOK (KR)
JANG YONG-HAN (KR)
SON GYEONG-SEON (KR)
LEE TAE-YUN (KR)
LEE JAE-DONG (KR)
GO YOUNG-BOK (KR)
JANG YONG-HAN (KR)
Application Number:
PCT/KR2019/007979
Publication Date:
January 07, 2021
Filing Date:
July 01, 2019
Export Citation:
Assignee:
XAVIS CO LTD (KR)
International Classes:
G01N23/04; G01B11/04; H01M10/48
Foreign References:
| KR20190013014A | 2019-02-11 | |||
| KR20040067908A | 2004-07-30 | |||
| KR20180000504A | 2018-01-03 | |||
| JP2017142217A | 2017-08-17 | |||
| KR20160068414A | 2016-06-15 | |||
| KR20180111428A | 2018-10-11 |
Attorney, Agent or Firm:
YANG, Jeong-Kun (KR)
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