Title:
CRYSTAL PHASE QUANTITATIVE ANALYSIS DEVICE, CRYSTAL PHASE QUANTITATIVE ANALYSIS METHOD, AND CRYSTAL PHASE QUANTITATIVE ANALYSIS PROGRAM
Document Type and Number:
WIPO Patent Application WO/2017/149913
Kind Code:
A1
Abstract:
Provided are an X-ray analysis operation guide system, operation guide method and operation guide program with which it is easy for a user to understand a measurement of an X-ray optical system to be selected. This crystal phase quantitative analysis device is provided with: a qualitative analysis result acquiring means for acquiring information relating to a plurality of crystal phases contained in a specimen; and a weight ratio calculating means for calculating the weight ratios of the plurality of crystal phases on the basis of the sum of diffraction intensities subjected to correction with respect to the Lorentz-polarization factor, for the plurality of crystal phases, the chemical formula weights for the plurality of crystal phases, and the sum of the squares of the number of electrons belonging to each atom contained in each chemical formula unit, for the plurality of crystal phases.
Inventors:
TORAYA HIDEO (JP)
HIMEDA AKIHIRO (JP)
HIMEDA AKIHIRO (JP)
Application Number:
PCT/JP2016/088488
Publication Date:
September 08, 2017
Filing Date:
December 22, 2016
Export Citation:
Assignee:
RIGAKU DENKI CO LTD (JP)
International Classes:
G01N23/207
Foreign References:
| JP2013134169A | 2013-07-08 | |||
| JP2008070331A | 2008-03-27 | |||
| JP2005534028A | 2005-11-10 |
Other References:
See also references of EP 3425379A4
Attorney, Agent or Firm:
HARUKA PATENT & TRADEMARK ATTORNEYS (JP)
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