Title:
DEFECT DETECTION DEVICE, DEFECT DETECTION METHOD, DEFECT DETECTION SYSTEM, AND METHOD FOR MANUFACTURING DYNAMO-ELECTRICAL MACHINE
Document Type and Number:
WIPO Patent Application WO/2022/153821
Kind Code:
A1
Abstract:
With conventional inspection devices, although it is possible to establish the presence of a completely penetrating defect such as a pinhole, it is difficult to detect a defect of an extent such that there is no exposure of a metal wire. In order to solve this problem, the present invention comprises an electrode (8) formed so as to be impregnated with an electroconductive liquid (7) and so that the electroconductive liquid (7) is in contact with the periphery of an insulator layer of a magnet wire (2). The discharge charge amount of a partial discharge occurring between the magnet wire (2) and the electroconductive liquid (7) is measured, whereby a defect in an insulation coating is detected.
Inventors:
MISAWA TAKAHIRO (JP)
SARUWATARI HIDENORI (JP)
TAKAHASHI TEIJI (JP)
SARUWATARI HIDENORI (JP)
TAKAHASHI TEIJI (JP)
Application Number:
PCT/JP2021/047803
Publication Date:
July 21, 2022
Filing Date:
December 23, 2021
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G01N27/24; G01N27/92; G01R31/12
Foreign References:
| JPS5324626B1 | 1978-07-21 | |||
| JPH08211115A | 1996-08-20 | |||
| JP2016180629A | 2016-10-13 | |||
| JP2006300532A | 2006-11-02 | |||
| JP2004347523A | 2004-12-09 | |||
| JP2009236887A | 2009-10-15 | |||
| JP2014182053A | 2014-09-29 |
Attorney, Agent or Firm:
PALMO PATENT FIRM, P.C. (JP)
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