Title:
DEFECT DETECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2022/250481
Kind Code:
A1
Abstract:
The present invention provides a defect detection device comprising: a display module; a camera module for outputting an image of a product produced during a production process; and a control module for detecting a specific defect area matching a configured product defect area among a plurality of divided product areas in the image, and generating defect pattern information for the specific defect area so as to display same on the display module.
Inventors:
KIM BYUNG-GYU (KR)
CHOI YOUNG-JU (KR)
PARK HYE-JIN (KR)
CHOI YOUNG-JU (KR)
PARK HYE-JIN (KR)
Application Number:
PCT/KR2022/007517
Publication Date:
December 01, 2022
Filing Date:
May 26, 2022
Export Citation:
Assignee:
PROJECT NOAH INC (KR)
International Classes:
G01N21/88; B07C5/34; B07C5/36; G01N21/956; G06N3/04; G06N3/08; G06T7/00; G06T7/11
Foreign References:
| KR102235747B1 | 2021-04-01 | |||
| KR102242996B1 | 2021-04-21 | |||
| KR20170122540A | 2017-11-06 | |||
| KR20160105082A | 2016-09-06 | |||
| KR20180004046A | 2018-01-10 |
Attorney, Agent or Firm:
KANG, Bum-Ju (KR)
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