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Title:
DEGRADATION DEGREE ESTIMATION PROGRAM, DEGRADATION DEGREE ESTIMATION METHOD, AND DEGRADATION DEGREE ESTIMATION DEVICE
Document Type and Number:
WIPO Patent Application WO/2022/162882
Kind Code:
A1
Abstract:
This degradation degree estimation device acquires a first state of a device when the device is operated during a first period, and one or more first environment information pieces about the surroundings of the device, and stores the first state and the first environment information in a storage unit. The degradation degree estimation device generates a model for predicting the first state from the first environment information. The degradation degree estimation device acquires a second state of the device when the device is operated during a second period, and one or more second environment information pieces about the surroundings of the device. The degradation degree estimation device calculates a third state by inputting the second environment information to the model. The degradation degree estimation device calculates the degree of degradation from the first period to the second period on the basis of the second state and the third state, and outputs the degree of degradation.

Inventors:
ITO, Toshio (JP)
Application Number:
PCT/JP2021/003288
Publication Date:
August 04, 2022
Filing Date:
January 29, 2021
Export Citation:
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Assignee:
FUJITSU LIMITED (JP)
International Classes:
G06N20/10; B63B79/30
Attorney, Agent or Firm:
SAKAI INTERNATIONAL PATENT OFFICE (JP)
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