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Title:
DEVICE AND METHOD FOR ELIMINATING DEFECTS IN SHEET, DEVICE FOR CONTROLLING ELIMINATION OF DEFECTS IN SHEET, AND DEVICE FOR PRODUCING CARDBOARD SHEET
Document Type and Number:
WIPO Patent Application WO/2018/055856
Kind Code:
A1
Abstract:
A device and method for eliminating defects in a sheet, a device for controlling the elimination of defects in a sheet, and a device for producing a cardboard sheet, wherein there are provided: a defect detection device (51) that detects the position of defective parts (R) in a core paper (B1, B2); a slitter/scorer (24) that cuts a continuous double-sided cardboard sheet (E) along a transport direction, to a prescribed width; a cutoff (26) that cuts off a plurality of continuous double-sided cardboard sheets (E1, E2) along a width direction to a prescribed length, the continuous double-sided cardboard sheets (E1, E2) having been cut to the prescribed width; a web director (25) that distributes the plurality of continuous double-sided cardboard sheets (E1, E2) to respective conveyance tables (41, 42); a defective-product-eliminating device (27) that eliminates plate-shaped double-sided cardboard sheets (F1, F2) from a conveyance line; and a control device (52) that specifies the plate-shaped double-sided cardboard sheets (F1, F2) having defective parts (R) on the basis of the position of the defective parts (R) and the width-direction cutting position on the continuous double-sided cardboard sheets (E1, E2), and operates the defective-product-eliminating device (27) handling the plate-shaped double-sided cardboard sheets (F1, F2).

Inventors:
TAKEMOTO SHUICHI (JP)
FUKUSHIGE NAOYUKI (JP)
Application Number:
PCT/JP2017/022468
Publication Date:
March 29, 2018
Filing Date:
June 19, 2017
Export Citation:
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Assignee:
MITSUBISHI HEAVY IND MACH SYSTEMS LTD (JP)
International Classes:
B31F1/24
Foreign References:
JPH07186309A1995-07-25
JPH1029254A1998-02-03
JP2007152690A2007-06-21
JPH06210772A1994-08-02
Other References:
See also references of EP 3431277A4
Attorney, Agent or Firm:
SAKAI INTERNATIONAL PATENT OFFICE (JP)
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