Title:
DISPLAY DEVICE INSPECTING APPARATUS, AND DISPLAY DEVICE INSPECTING METHOD
Document Type and Number:
WIPO Patent Application WO/2014/174631
Kind Code:
A1
Abstract:
Included are: a test image generation unit (11) for generating a test image including graphics having mutually different gray scales and for generating an answer for the test image; a display unit (12) for displaying the test image; an input unit (13) for inputting a visual recognition result for the displayed test image; a determination unit (14) for determining, on the basis of the answer and the visual recognition result that correspond to the test image, whether the answer matches the visual recognition result; a storage unit (15) for storing the determination result; and an output unit (16) for outputting the stored determination result.
Inventors:
ARAI YUTAKA (JP)
Application Number:
PCT/JP2013/062208
Publication Date:
October 30, 2014
Filing Date:
April 25, 2013
Export Citation:
Assignee:
NEC DISPLAY SOLUTIONS LTD (JP)
International Classes:
H04N17/04; H04N5/66
Domestic Patent References:
| WO2002005256A1 | 2002-01-17 |
Foreign References:
| JP2006292881A | 2006-10-26 | |||
| JP2004329795A | 2004-11-25 | |||
| JP2002315725A | 2002-10-29 |
Attorney, Agent or Firm:
TANAI Sumio et al. (JP)
Sumio Tanai (JP)
Sumio Tanai (JP)
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