Title:
ELECTRON BEAM IRRADIATION BEAM DETECTION SYSTEM AND USE METHOD THEREFOR
Document Type and Number:
WIPO Patent Application WO/2022/166629
Kind Code:
A1
Abstract:
An electron beam irradiation beam detection system and a use method therefor. The electron beam irradiation beam detection system comprises an electron emission module, a detection module (3), an acquisition module (8), and a data processing module (4); the electron emission module comprises an electron beam source (1) and a plurality of electrons (2); the detection module (3) comprises a magnetic circuit (5) and a coil (7). The electron beam source (1) emits the electrons (2) into the air, the electrons (2) are detected when passing through the detection module (3), then a signal is acquired by the acquisition module (8), and the acquisition module (8) transmits the signal to the data processing module (4) for data processing to obtain electron beam intensity, so as to obtain the amount of the electrons (2), thereby providing a good feedback condition for the whole system.
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Inventors:
GU SHENGDONG (CN)
TANG JIHONG JERRY (CN)
TANG JIHONG JERRY (CN)
Application Number:
PCT/CN2022/073360
Publication Date:
August 11, 2022
Filing Date:
January 24, 2022
Export Citation:
Assignee:
HUZHOU ADVANCED ELECTRONIC TECH CO LTD (CN)
International Classes:
G01T1/29
Foreign References:
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Attorney, Agent or Firm:
SHANGHAI YUNHU PATENT AGENCY (GENERAL PARTNERSHIP) (CN)
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