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Patent Searching and Data


Title:
ELECTRONIC COMPONENT TEST HANDLER
Document Type and Number:
WIPO Patent Application WO/2020/213874
Kind Code:
A1
Abstract:
The present invention relates to an electronic component test handler comprising: a test tray provided with a plurality of inserts configured to selectively secure a device; an insert opening module configured to open the plurality of inserts disposed in a partition region of the test tray; a hand configured to pick up a device from the plurality of inserts and sort the same; and a control unit for controlling the insert opening module and the hand so as to open the plurality of inserts disposed in different partition regions when the classification of the device has been completed in the partition region. When a device is classified, an electronic component test handler according to the present invention divides a flat region in a test tray into a partition region, transfers the test tray to each partition region, and performs classification, thereby minimizing the waiting time for classification of a hand. Accordingly, the efficiency of classification can be maximized.

Inventors:
LEE TAEK SEON (KR)
YEO DONG HYUN (KR)
RYU IL HA (KR)
Application Number:
PCT/KR2020/004721
Publication Date:
October 22, 2020
Filing Date:
April 08, 2020
Export Citation:
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Assignee:
ATECO INC (KR)
International Classes:
G01R31/28; H01L21/67; H01L21/677
Foreign References:
KR20080008661A2008-01-24
KR20150129904A2015-11-23
KR20180067811A2018-06-21
KR20100013057A2010-02-09
KR20150096912A2015-08-26
Attorney, Agent or Firm:
ENVISION PATENT & LAW FIRM (KR)
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