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Patent Searching and Data


Title:
ELECTRONIC DEVICE SCREEN AREA DEFECT DETECTION METHOD AND DEVICE
Document Type and Number:
WIPO Patent Application WO/2021/082923
Kind Code:
A1
Abstract:
The present application aims to provide an electronic device screen area defect detection method and device. Compared with the prior art, the method comprises: obtaining an appearance image comprising a screen area of an electronic device; extracting a screen area image from the appearance image; inputting the screen area image into a trained model in combination with an FPN network and a backbone network; and receiving an output defect detection result of the screen area image of the electronic device from the model in combination with the FPN network and the backbone network, wherein the defect detection result comprises the defect type of the screen area of the electronic device, the position of the defect in the screen area of the electronic device, and the confidence level of the defect detection result. A defect difference of a screen area of a second-hand electronic device such as a mobile phone can be accurately identified.

Inventors:
XU PENG (CN)
SHEN SHENGYUAN (CN)
CHANG SHULIN (CN)
YAO JUHU (CN)
Application Number:
PCT/CN2020/120881
Publication Date:
May 06, 2021
Filing Date:
October 14, 2020
Export Citation:
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Assignee:
SHANGHAI YUEYI NETWORK INFORMATION TECH CO LTD (CN)
International Classes:
G06T7/00; G06K9/62; G06N3/04
Foreign References:
CN109859163A2019-06-07
CN107123111A2017-09-01
CN110349135A2019-10-18
CN109978875A2019-07-05
EP3115935B12019-01-30
CN110796646A2020-02-14
CN110796647A2020-02-14
Attorney, Agent or Firm:
FORIDOM IP LAW FIRM (CN)
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