Title:
ELECTRONIC DEVICE SURFACE SIGNAL CONTROL PROBE AND METHOD OF MANUFACTURING THE PROBE
Document Type and Number:
WIPO Patent Application WO/2000/033052
Kind Code:
A1
Abstract:
A surface signal control probe high in resolution, rigidity, and bending elasticity which can be used for a scanning probe microscope and a highly accurate surface signal control probe for inputting and outputting signals which can be used for a high density magnetic information processing device, comprising a nanotube (24) small in tip curvature radius and high in rigidity and bending elasticity, a holder (2a) holding the nanotube (24), and a fixing means fixing the base part (24b) of the nanotube to the surface of the holder with the tip part (24a) of the nanotube (24) projecting from the holder, wherein the tip part (24a) of the nanotube is used as a probe and the fixing means is formed of a coating film (29) covering the base part (24b) of the nanotube (24) and a fused part where the base part (24b) is fused to the surface of the holder.
Inventors:
NAKAYAMA YOSHIKAZU (JP)
AKITA SEIJI (JP)
HARADA AKIO (JP)
AKITA SEIJI (JP)
HARADA AKIO (JP)
Application Number:
PCT/JP1999/006359
Publication Date:
June 08, 2000
Filing Date:
November 12, 1999
Export Citation:
Assignee:
DAIKEN CHEMICAL CO LTD (JP)
NAKAYAMA YOSHIKAZU (JP)
AKITA SEIJI (JP)
HARADA AKIO (JP)
NAKAYAMA YOSHIKAZU (JP)
AKITA SEIJI (JP)
HARADA AKIO (JP)
International Classes:
B23Q17/09; C01B31/02; G01B5/28; G01Q70/12; G01B7/34; G01B21/30; G01N1/04; G01N13/00; G01N19/02; G01N21/75; G01Q10/00; G01Q60/16; G01Q60/38; G01Q60/54; G01Q70/16; G11B5/127; G21G5/00; G21K7/00; (IPC1-7): G01N13/12; G01B21/30; G12B21/04
Foreign References:
| JPH06331309A | 1994-12-02 | |||
| JPH10208208A | 1998-08-07 |
Other References:
HONGJIE DAI ET AL.: "Nanotubes as nanoprobes in scanning probe microscopy", NATURE,, vol. 384, no. 6605, 1996, (LONDON), pages 147 - 150, XP002924387
STANISLAUS S. WONG ET AL.: "Carbon Nanotube Tips: High-Resolution Probes for Imaging Biological Systems", JOURNAL OF THE AMERICAN CHEMICAL SOCIETY,, vol. 120, no. 3, January 1998 (1998-01-01), (USA), pages 603 - 604, XP002924388
Y. NAKAYAMA.: "Carbon nanotube ga AFM (Atomic Force Microscope) no Tip ni natta", KAGAKU., vol. 54, no. 8, August 1999 (1999-08-01), (JAPAN), pages 42 - 47, XP002929940
KUNITOSHI YAMAMOTO ET AL.: "RAPID COMMUNICATIONS Orientation and purification of carbon nanotubes using as electrophoresis", JOURNAL OF PHYSICS D: APPLIED PHYSICS,, vol. 31, no. 8, April 1998 (1998-04-01), (U.K.), pages L34 - L36, XP002924389
See also references of EP 1054249A4
STANISLAUS S. WONG ET AL.: "Carbon Nanotube Tips: High-Resolution Probes for Imaging Biological Systems", JOURNAL OF THE AMERICAN CHEMICAL SOCIETY,, vol. 120, no. 3, January 1998 (1998-01-01), (USA), pages 603 - 604, XP002924388
Y. NAKAYAMA.: "Carbon nanotube ga AFM (Atomic Force Microscope) no Tip ni natta", KAGAKU., vol. 54, no. 8, August 1999 (1999-08-01), (JAPAN), pages 42 - 47, XP002929940
KUNITOSHI YAMAMOTO ET AL.: "RAPID COMMUNICATIONS Orientation and purification of carbon nanotubes using as electrophoresis", JOURNAL OF PHYSICS D: APPLIED PHYSICS,, vol. 31, no. 8, April 1998 (1998-04-01), (U.K.), pages L34 - L36, XP002924389
See also references of EP 1054249A4
Attorney, Agent or Firm:
Miki, Hisami (Mozu-Umekita-cho 3-cho Sakai-shi Osaka, JP)
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