Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
EXTRACTION METHOD FOR RANDOM WALK CAPACITANCE PARAMETERS FOR PROCESSING SUSPENDED CONDUCTOR
Document Type and Number:
WIPO Patent Application WO/2019/119759
Kind Code:
A1
Abstract:
Provided is an extraction method for random walk capacitance parameters for processing suspended conductor, wherein a closed integral surface having 26 faces is constructed for each suspended conductor block, and the corresponding random sampling is performed to obtain a jumping scheme when the random walk path encounters the suspended conductor. By combining with the rejection sampling technique, the method can process a complex shaped suspended conductor composed of multiple rectangular solids. When the method is used for the extraction method for suspended random walk capacitance, the capacitance parameter of the integrated circuit interconnect structure including the suspended conductor can be calculated relatively quickly and accurately, and the calculation robustness and calculation efficiency are improved.

Inventors:
YU WENJIAN (CN)
Application Number:
PCT/CN2018/092482
Publication Date:
June 27, 2019
Filing Date:
June 22, 2018
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
UNIV TSINGHUA (CN)
International Classes:
G06F17/50
Foreign References:
CN107844674A2018-03-27
CN105930572A2016-09-07
CN102651047A2012-08-29
CN105335567A2016-02-17
US20160180007A12016-06-23
US20160342729A12016-11-24
Attorney, Agent or Firm:
TSINGYIHUA INTELLECTUAL PROPERTY LLC (CN)
Download PDF:



 
Previous Patent: A CHIP SLOT AND NETWORK SYSTEM

Next Patent: WINDING MACHINE