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Patent Searching and Data


Title:
EYE EXAMINATION DEVICE AND EYE EXAMINATION PROGRAM
Document Type and Number:
WIPO Patent Application WO/2020/203323
Kind Code:
A1
Abstract:
Provided is an eye examination device that examines an eye of a subject, the eye examination device including an imaging optical system for imaging the eye and a setting means for setting an examination condition for the eye examination device, wherein the imaging optical system is capable of imaging an identifier with which an individual examination condition that is preset on a per subject basis is associated, and the setting means sets the examination condition for the eye examination device on the basis of the individual examination condition associated with the identifier when imaged by the imaging optical system. The eye can thus be efficiently examined.

Inventors:
KANOU TETSUYA (JP)
HIGUCHI YUKIHIRO (JP)
Application Number:
PCT/JP2020/012128
Publication Date:
October 08, 2020
Filing Date:
March 18, 2020
Export Citation:
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Assignee:
NIDEK KK (JP)
International Classes:
A61B3/10
Foreign References:
JPH1085189A1998-04-07
JPH09234186A1997-09-09
JP2012217710A2012-11-12
JP2018171368A2018-11-08
JP2015112436A2015-06-22
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