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Patent Searching and Data


Title:
FAILURE SIGN DIAGNOSIS DEVICE AND METHOD THEREFOR
Document Type and Number:
WIPO Patent Application WO/2020/255560
Kind Code:
A1
Abstract:
According to the present invention, a sensor combination that is effective for failure sign diagnosis is automatically generated in consideration of a hidden relationship between sensor data. The present invention comprises: a time shift data generation unit 106 that processes sensor data acquired from a device and generates the processed sensor data; and a sensor combination and preprocessing condition generation unit 112 that generates a sensor combination on the basis of a correlation coefficient between the sensor data and the processed sensor data, and generates, as a pre-processing condition, a processing condition for increasing a correlation coefficient between sensors for each sensor combination, wherein failure sign diagnosis of the device is performed on the basis of a change in the relationship between the sensor data included in the sensor combination and the processed sensor data.

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Inventors:
FUJIWARA JYUNSUKE (JP)
SUZUKI HIDEAKI (JP)
KONO TOSHIAKI (JP)
ODAKA TOSHIYUKI (JP)
Application Number:
PCT/JP2020/017676
Publication Date:
December 24, 2020
Filing Date:
April 24, 2020
Export Citation:
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Assignee:
HITACHI LTD (JP)
International Classes:
G05B23/02
Foreign References:
JP2017010263A2017-01-12
JP2003208219A2003-07-25
JP2014186631A2014-10-02
JP2009146086A2009-07-02
JP2009199533A2009-09-03
JP2000505221A2000-04-25
Attorney, Agent or Firm:
POLAIRE I.P.C. (JP)
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