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Patent Searching and Data


Title:
FIELD DISTRIBUTION MEASURING METHOD AND DEVICE
Document Type and Number:
WIPO Patent Application WO/2001/084165
Kind Code:
A1
Abstract:
A field distribution measuring method for measuring the spatial distribution of an electric field or a magnetic field by conducting a measurement at a plurality of sampling points while continuously scanning by a probe, wherein a sampling deviation amount is calculated based on a spurious vector generated due to a deviation between a probe position and a measuring timing and the distribution of an electrical field or a magnetic field is measured allowing for the deviation amount, whereby it is possible to properly remove a measuring noise generated by the deviation between a probe traveling position and a measuring timing.

Inventors:
KITAYOSHI HITOSHI (JP)
Application Number:
PCT/JP2001/003344
Publication Date:
November 08, 2001
Filing Date:
April 19, 2001
Export Citation:
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Assignee:
ADVANTEST CORP (JP)
KITAYOSHI HITOSHI (JP)
International Classes:
G01R29/10; G01R29/08; G01R33/10; (IPC1-7): G01R29/08; G01R33/10
Foreign References:
JPS60192271A1985-09-30
JPH0348776A1991-03-01
JPH06242163A1994-09-02
Other References:
See also references of EP 1191340A4
Attorney, Agent or Firm:
Kitano, Yoshihito (Daikyo-cho Shinjuku-ku, Tokyo, JP)
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