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Patent Searching and Data


Title:
FREQUENCY RESPONSE MEASUREMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2014/196003
Kind Code:
A1
Abstract:
A frequency response measurement device according to an embodiment which measures a frequency response of a servo system which feedback controls a mechanical system comprises: a vibration condition setting unit which sets a plurality of different vibration conditions; a vibration execution unit which executes a plurality of vibration iterations upon the servo system with shake signals of the different vibration conditions; and a frequency response computation unit which acquires a combination of an identification input signal and an identification output signal for each of the plurality of vibration iterations from a control system of the servo system which is vibrated over the plurality of iterations, and computes the frequency response on the basis of the vibration condition and the combination of the identification input signal and the identification output signal for each of the plurality of vibration iterations.

Inventors:
NAGAOKA KOTARO (JP)
FUJITA TOMOYA (JP)
OZAWA MASAHIRO (JP)
Application Number:
PCT/JP2013/065380
Publication Date:
December 11, 2014
Filing Date:
June 03, 2013
Export Citation:
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Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G05D3/12
Foreign References:
JP2000275370A2000-10-06
JP2000278990A2000-10-06
Attorney, Agent or Firm:
SAKAI, HIROAKI (JP)
Hiroaki Sakai (JP)
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