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Patent Searching and Data


Title:
FUNCTIONAL FILM INSPECTION METHOD, INSPECTION SYSTEM, AND WEB ROLL
Document Type and Number:
WIPO Patent Application WO/2021/117671
Kind Code:
A1
Abstract:
[Problem] To provide a functional film inspection method and the like, with which it is possible to properly manage defect information of a functional film. [Solution] The present invention comprises: a first step for acquiring functional-film defect information through inspection performed on a long functional film F1 which is bonded to either a long light polarizer or a long optical laminate comprising a light polarizer so as to produce a long polarizing film F2; a second step for printing identification information at a widthwise edge of the functional film at a prescribed interval in the longitudinal direction of the functional film; and a third step for storing the functional-film defect information in association with the identification information.

Inventors:
MIKASA YASUYUKI (JP)
MATSUBAYASHI KYOHEI (JP)
TATSUBO HIROKAZU (JP)
MURAKAMI YOSUKE (JP)
KOMARU TSUYOSHI (JP)
Application Number:
PCT/JP2020/045455
Publication Date:
June 17, 2021
Filing Date:
December 07, 2020
Export Citation:
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Assignee:
NITTO DENKO CORP (JP)
International Classes:
G02B5/30; G01N21/892
Foreign References:
JP2003202298A2003-07-18
JP2008116438A2008-05-22
JP2005062165A2005-03-10
JP2008175940A2008-07-31
JP2017137527A2017-08-10
JP2003114328A2003-04-18
JPH0839669A1996-02-13
US20070095451A12007-05-03
Attorney, Agent or Firm:
MAKOTO INTERNATIONAL PATENT ATTORNEYS OFFICE (JP)
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