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Patent Searching and Data


Title:
HIGH RESOLUTION TIME-OF-FLIGHT MEASUREMENTS
Document Type and Number:
WIPO Patent Application WO/2020/070280
Kind Code:
A3
Abstract:
Modulated light is generated using a light source of a sensor module. Using a photodetector of the sensor module, an intensity of modulated light reflected from an object towards the photo detector is measured over a period of time. An electronic control device bins the measured intensity of the reflected modulated light according to a plurality of temporal bins, determines a first temporal bin having the greatest intensity among the plurality of temporal bins, and estimates a distance between the sensor module and the object based on a first temporal bin, and one or more additional temporal bins of the plurality of temporal bins.

Inventors:
NELSON DOUG (US)
HEGDE PRADEEP (US)
COGAN TIMOTHY (US)
Application Number:
PCT/EP2019/076895
Publication Date:
May 14, 2020
Filing Date:
October 04, 2019
Export Citation:
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Assignee:
AMS AG (AT)
International Classes:
G01S7/4915; G01S7/48; G01S7/497; G01S17/18; G01S17/36; G01S17/931
Foreign References:
DE10138531A12003-03-06
EP3250944B12019-03-06
Other References:
HARTZELL PRESTON J ET AL: "Empirical Waveform Decomposition and Radiometric Calibration of a Terrestrial Full-Waveform Laser Scanner", IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING, IEEE SERVICE CENTER, PISCATAWAY, NJ, US, vol. 53, no. 1, 1 January 2015 (2015-01-01), pages 162 - 172, XP011555430, ISSN: 0196-2892, [retrieved on 20140804], DOI: 10.1109/TGRS.2014.2320134
Attorney, Agent or Firm:
MARKS & CLERK LLP (GB)
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